doc. RNDr. Karel Žídek, Ph.D.

doc. RNDr. Karel Žídek, Ph.D.
Institute of New Technologies and Applied Informatics (NTI): Academic staff

E-mail:: karel.zidek@tul.cz
Tel.:: +420 48535

Publications

LUKEŠ, J. et al. Sensitive detection of Si3N4 thin-film defects via second harmonic generation microscopy Optics Letters Optica Publishing Group, 2025 P. 1885. ISSN: 0146-9592.
MILLER, V. , and ŽÍDEK, K. Visualization techniques for assessing inhomogeneities and stress in Ti:sapphire crystals Optical Materials Express (2159-3930) Optica Publishing Group, 2025, vol. 15, issue 4. P. 644 – 660. ISSN: 2159-3930.
LUKEŠ, J. et al. Damage detection in thin films using second harmonic generation Proceedings of SPIE - The International Society for Optical Engineering SPIE, 2024 P. neuvedeny (3 stranky). ISBN: 978-151067358-8, ISSN: 0277-786X.
KLEIN, L. , and ŽÍDEK, K. Spatial modulations testing in a hyperspectral single-pixel microscopy UNCONVENTIONAL OPTICAL IMAGING IV SPIE-INT SOC OPTICAL ENGINEERING, 2024 P. neuvedeny (4 stranky). ISSN: 0277-786X.
MILLER, V. , and ŽÍDEK, K. Visualization of inhomogeneities in Ti:Sapphire laser medium EOS ANNUAL MEETING, EOSAM 2024 E D P SCIENCES, 2024 P. neuvedeny (2 stranky). ISSN: 2100-014X.
všechny publikace
MACH, M., PSOTA, P., ŽÍDEK, K. , and MOKRÝ, P. Compact lensless Fizeau holographic interferometry for imaging domain patterns in ferroelectric single crystals Applied Optics OPTICA, 2023, vol. 62, issue 10. P. 2522 – 2530. ISSN: 1559-128X.
LUKEŠ, J. , and ŽÍDEK, K. Heat-Induced Variation of Second-Harmonic Generation in Silicon Oxynitride Thin Films, 2023
MILLER, V. , and ŽÍDEK, K. High-precision FoM measurement setup for Ti:sapphire crystals Applied Optics Optica, 2023, vol. 62, issue 5. P. 1345 – 1350. ISSN: 1559-128X.
JUNEK, J. , and ŽÍDEK, K. Nanosecond compressive fluorescence lifetime microscopy imaging via the RATS method with a direct reconstruction of lifetime maps Optics Express WASHINGTON: OPTICA publishing group, 2023, vol. 31, issue 4. P. 5181 – 5199. ISSN: 1094-4087.
MACH, M., PSOTA, P., ŽÍDEK, K. , and MOKRÝ, P. On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples OPTICS EXPRESS Optica, 2023, vol. 31, issue 11. P. 17185 – 17200. ISSN: 1094-4087.
LUKEŠ, J. et al. Optically modified second harmonic generation in silicon oxynitride thin films via local layer heating Scientific Reports BERLIN: Springer Science and Business Media LLC, 2023, vol. 13, issue 1. P. neuvedeny (8 stran). ISSN: 2045-2322.
KLEIN, L., TOUŠ, J. , and ŽÍDEK, K. Spatially Encoded Compressive Microscope for Ultrabroadband VIS/NIR/SWIR Hyperspectral Imaging 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)., 2023pp. ISBN: 979-8-3503-4599-5, ISSN: 2833-1052.
KLEIN, L., TOUŠ, J. , and ŽÍDEK, K. Spatially encoded hyperspectral compressive microscope for ultrabroadband VIS/NIR hyperspectral imaging Applied Optics WASHINGTON: Optica Publishing Group, 2023, vol. 62, issue 15. P. 4030 – 4039. ISSN: 1559-128X.
HLUBUČEK, J., LUKEŠ, J., VÁCLAVÍK, J. , and ŽÍDEK, K. Differential coded aperture single-snapshot spectral imaging Optics Letters WASHINGTON: Optica Publishing Group, 2022, vol. 47, issue 9. P. 2342 – 2345. ISSN: 0146-9592.
JUNEK, J. , and ŽÍDEK, K. Noise effect on 2D photoluminescence decay analysis using the RATS method in a single-pixel camera configuration OPTICS EXPRESS OPTICAL SOC AMER, 2022, vol. 30, issue 8. P. 12654 – 12669. ISSN: 1094-4087.
KLEIN, L., ŽÍDEK, K., KRISTOFFERSEN, A. S. , and TOUŠ, J. Versatile compressive microscope for hyperspectral transmission and fluorescence lifetime imaging OPTICS EXPRESS Optica Publishing Group, 2022, vol. 30, issue 9. P. 15708 – 15720. ISSN: 1094-4087.
DAS, N., KANCLÍŘ, V., MOKRÝ, P. , and ŽÍDEK, K. Bulk and interface second harmonic generation in the Si3N4 thin films deposited via ion beam sputtering Journal of Optics (United Kingdom) 1. ed. IOP PUBLISHING LTD, 2021, vol. 23, issue 2. P. neuvedeny (6 stran). ISSN: 2040-8978.
JUNEK, J. , and ŽÍDEK, K. Fluorescence Lifetime Imaging Via Spatio-temporal Speckle Patterns in a Single-pixel Camera Configuration OPTICS EXPRESS 1. ed. OPTICAL SOC AMER, 2021, vol. 29, issue 4. P. 5538 – 5551. ISSN: 1094-4087.
HLUBUČEK, J., LUKEŠ, J. , and ŽÍDEK, K. Improving Compression Ratio in CASSI Optics InfoBase Conference Papers (ISBN: 978-1-943580-89-7) The Optical Society, 2021 P. neuvedeny (2 stranky). ISBN: 978-155752820-9, ISSN: 2162-2701.
JUNEK, J. , and ŽÍDEK, K. Noise Effect to Data Acquisition Time in FLIM via RATS Method Using Single-Pixel Camera Configuration Optics InfoBase Conference Papers The Optical Society, 2021 P. neuvedeny (2 stranky). ISBN: 978-155752820-9.
KANCLÍŘ, V., ŽÍDEK, K. , and VÁCLAVÍK, J. Precision of Silicon Oxynitride Refractive-Index Profile Retrieval Using Optical Characterization Acta Physica Polonica A 1. ed. Institute of Physics, Polish Academy of Sciences, 2021, vol. 140, issue 3. P. 215 – 221. ISSN: 0587-4246.
JUNEK, J. , and ŽÍDEK, K. FLIM via RATS Method Using Single Pixel Camera Optics InfoBase Conference Papers 1. ed. The Optical Society, 2020 P. neuvedeny (2 stranky). ISBN: 978-155752820-9.
JUNEK, J., ONDIČ, L. , and ŽÍDEK, K. Random Temporal Laser Speckles for the Robust Measurement of Sub-microsecond Photoluminescence Decay OPTICS EXPRESS 1. ed. WASHINGTON: OPTICAL SOC AMER, 2020, vol. 28, issue 8. P. 12363 – 12372. ISSN: 1094-4087.
JUNEK, J. , and ŽÍDEK, K. Luminescence Decay Measurement Via Temporal Speckles Optics InfoBase Conference Papers 1. ed. Optical Society of America, 2019 P. neuvedeny (2 stranky). ISBN: 978-155752820-9.

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doc. RNDr. Karel Žídek, Ph.D.

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