Ing. Vít Kanclíř

Ing. Vít Kanclíř
Institute of New Technologies and Applied Informatics (NTI): Internal postgraduate student

Publications

LUKEŠ, J. et al. Sensitive detection of Si3N4 thin-film defects via second harmonic generation microscopy Optics Letters Optica Publishing Group, 2025 P. 1885. ISSN: 0146-9592.
LUKEŠ, J. et al. Damage detection in thin films using second harmonic generation Proceedings of SPIE - The International Society for Optical Engineering SPIE, 2024 P. neuvedeny (3 stranky). ISBN: 978-151067358-8, ISSN: 0277-786X.
LUKEŠ, J. et al. Optically modified second harmonic generation in silicon oxynitride thin films via local layer heating Scientific Reports BERLIN: Springer Science and Business Media LLC, 2023, vol. 13, issue 1. P. neuvedeny (8 stran). ISSN: 2045-2322.
DAS, N., KANCLÍŘ, V., MOKRÝ, P. , and ŽÍDEK, K. Bulk and interface second harmonic generation in the Si3N4 thin films deposited via ion beam sputtering Journal of Optics (United Kingdom) 1. ed. IOP PUBLISHING LTD, 2021, vol. 23, issue 2. P. neuvedeny (6 stran). ISSN: 2040-8978.
KANCLÍŘ, V., ŽÍDEK, K. , and VÁCLAVÍK, J. Precision of Silicon Oxynitride Refractive-Index Profile Retrieval Using Optical Characterization Acta Physica Polonica A 1. ed. Institute of Physics, Polish Academy of Sciences, 2021, vol. 140, issue 3. P. 215 – 221. ISSN: 0587-4246.
všechny publikace

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